Here at MVMTC we offer complete root cause of failure analysis when performance issues arise. Our Scanning Electron Microscopy or SEM analysis is used in microanalysis and failure analysis of solid inorganic materials. SEM microscopy is performed at high magnifications and precisely measures very small features of a specimen. The SEM also generates high-resolution images allowing for in-depth structural analysis. MVMTC performs structural analysis using our Amray 1830 Scanning Electron Microscope, providing detailed reporting and analysis for a variety of specifications.