sem analysis
Here at MVMTC we offer complete root cause of failure analysis when performance issues arise. Our Scanning Electron Microscopy or SEM analysis is used in microanalysis and failure analysis of solid inorganic materials. SEM microscopy is performed at high magnifications and precisely measures very small features of a specimen. The SEM also generates high-resolution images allowing for in-depth structural analysis. MVMTC performs structural analysis using our Amray 1830 Scanning Electron Microscope, providing detailed reporting and analysis for a variety of specifications.
TEST METHODS: ASTM E1508
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Do you have a need for materials testing? Send us a quote request! We would be glad to assist you with all of your materials testing and manufacturing consultation needs.
ADDRESS:
4155 Lisa Drive
Tipp City, Ohio 45371
PHONE: 937.669.4500
FAX: 937.669.4566